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Synchrotron diffractometer

Positioning the sample and detector

Project background

The ESRF synchrotron leases the most advanced equipment allowing industrial and research organizations to perform their atomic scale experiments.

The CRG-IF BM32 beamline is specialized in studying interfaces and surfaces at air or under ultra high vacuum by X-ray scattering techniques.

This beamline is dedicated to a team composed of scientists from the Atomic Energy Commission (CEA) and the French National Centre for Scientific Research (CNRS).

CUSTOMER REQUEST

The joint CEA-CNRS team used a 20 years old diffractometer to study nanostructures on surfaces during their growth. They chose SYMETRIE to provide a more powerful machine.

The new diffractometer performs 2 main functions:

Sample positioning: the sample is adjusted on the beam trajectory and can move in 6 degrees of freedom, thanks to a BREVA hexapod, to adjust the angle of incidence of the beam.

Detector positioning: to gather the diffracted X-rays characterizing the crystallographic structure of the sample, a detector moves freely on a spherical surface around the sample.

Project specifications

Easy access to the UHV chamber
Arm detector angular speed: 20°/s
Sphere of confusion sample: 50 µm
Sphere of confusion detector: 100 µm
BREVA hexapod resolution: 1 µm, 0.001°

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